Industry Insights
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What Is Practical Flatness?
5/3/2024
Discover how flatness impacts optical wavefronts in super-resolution microscopy, and learn to calculate its practical implications for your system's performance and imaging quality.
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Using Laser Dichroic Beamsplitters For Super-resolution And TIRF Microscopy
5/2/2024
Unlock the full potential of super-resolution & TIRF imaging with Semrock's advanced laser dichroic beamsplitters, offering unparalleled precision and compatibility for microscopy systems.
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Measuring Light With Wavelengths And Wavenumbers
5/2/2024
Understanding the "color" of light involves its distribution of intensity across wavelengths. In fields like Raman spectroscopy, reconciling wavelength and wavenumber units is crucial.
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Fluorescent Proteins: Theory Applications And Best Practices
5/1/2024
From the depths of the ocean to the forefront of science, fluorescent proteins have become indispensable tools in science. Discover their origins, evolution, and transformative applications.
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What Is FRET?
5/1/2024
Discover the intricacies of FRET (Fluorescence Resonance Energy Transfer), a pivotal technique unveiling molecular interactions, and explore fluorescent filters that excel in FRET applications.
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Using Fura-2 to Track Ca2+
5/1/2024
Discover the power of Fura-2 in calcium tracking. By leveraging its absorption spectrum, BrightLine® FURA2-C set offers unparalleled brightness, contrast, and precision for high-speed imaging.
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Multiband Filter Set Terminology
5/1/2024
Recent advancements in fluorescence imaging tackle the challenge of labeling multiple objects in a single sample. Explore innovative multiband filter sets for high-fidelity, multi-color imaging.
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Choosing Dichroic Beamsplitters With Flatness/RWE Appropriate To The Microscopy Method
5/1/2024
Learn how to optimize microscopy performance by selecting optical filters and dichroic beamsplitters to minimize wavefront distortion and ensure flatness standards.
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Semiconductor Wafer Inspection And Metrology With Multi-Axis Air Bearing Stage
4/30/2024
Discover how PI’s precision motion control solutions address the evolving challenges of semiconductor manufacturing, ensuring nanometer-level defect detection, high throughput, and reduced costs.
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Non-Contact Metrology With 6-Axis Hexapods
4/26/2024
Discover how a novel non-contact metrology method, TWI, leverages a 6-axis motion system, revolutionizing aspheric optics qualification for speed and precision.